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. Author manuscript; available in PMC: 2014 Jan 27.
Published in final edited form as: Proc SPIE Int Soc Opt Eng. 2013 Mar 28;8673:867312. doi: 10.1117/12.2007071

Table 1.

Intra-Rater Reliability

Label Axial
Outer Wall
Axial
Inner Wall
Sagittal
Outer Wall
Sagittal
Inner Wall
Xiphoid
Process
Left
AISP
Right ASIS

Metric μSD ± σSD μSD ± σSD μSD ± σSD μSD ± σSD
·22
·22
·22

Target 1 0.35 ± 0.11 0.32 ± 0.07 0.44 ± 0.17 0.47 ± 0.15 0.59 3.00 0.0
Target 2 0.87 ± 0.76 0.83 ± 0.44 2.18 ± 3.52 0.80 ± 0.65 0.67 0.84 0.0
Target 3 1.17 ± 0.90 0.35 ± 0.10 1.01 ± 0.98 0.55 ± 0.36 0.24 0.72 9.03
Target 4 0.31 ± 0.09 0.27 ± 0.04 0.40 ± 0.07 0.30 ± 0.05 0.33 10.13 1.14

Mean 0.68 ± 0.47 0.44 ± 0.16 1.01 ± 1.19 0.53 ± 0.30 0.45 3.67 2.54

μSD: Mean Surface Distance (mm), σSD: Std. Dev. Surface Distance (mm), ·22: L2 Norm Point Distance (mm)