Several L. pneumophila effectors cause a synthetic growth defect in the yeast arf and arl deletion mutants. Data represent a comparison of the degrees of lethal effect caused by RalF, CegC1, CegL1, lpg0375, CetLp6, and RavH in different yeast arf and arl deletion mutants plated in 10-fold serial dilutions under inducing conditions (galactose). The effectors (indicated above each panel) were overexpressed in the wild-type S. cerevisiae BY4741 strain (W.T.), the arf1 deletion mutant (arf1Δ), the arf2 deletion mutant (arf2Δ), the arl1 deletion mutant (arl1Δ), and the arl3 deletion mutant (arl3Δ). The vector on which the effectors were cloned (pGREG523) was used as a control (vector). CegC1 and CegL1 are presented as representatives of effectors that caused no additive effect in the arf and arl deletion mutants. The glucose control plates of this experiment are shown in Fig. S4 in the supplemental material.