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. 2014 Feb 4;4:3955. doi: 10.1038/srep03955

Figure 7. (a) 3D-FEM simulation of heat power irradiating on the MMPA (solid line), a 25 nm thick amorphous Ge2Sb2Te5 dielectric layer with 100 nm thick ground Au layer (dashed line), and 25 nm thick monolithic amorphous Ge2Sb2Te5 layer located at the beam center (dotted line), (b) Temperature during one pulse of amorphous Ge2Sb2Te5 layer in the MMPA (solid line), Ge2Sb2Te5 dielectric layer with ground Au layer (dashed line), single Ge2Sb2Te5 dielectric layer (dotted line).

Figure 7