Skip to main content
. 2014 Feb 10;4:4043. doi: 10.1038/srep04043

Figure 2. Characterization of rutile (101) films.

Figure 2

(a) and (b) RHEED pattern along the <010> and <−101> azimuths, respectively. (b) and (c) show ambient AFM images, indicating two crystal orientations due to twinning in the film. (e) cross-sectional TEM of the Al2O3/rutile interface, with (f) showing the diffraction pattern of the interface indicating the epitaxial alignment of the rutile film.