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. 2014 Feb 10;9(2):e88723. doi: 10.1371/journal.pone.0088723

Figure 1. Characterization of CuO NP used in the present study.

Figure 1

(A) Representative transmission electron microscopy (TEM) images of the CuO NP at two magnifications. The polydisperse size distribution of CuO NP (n = 245) determined from TEM images is shown in the insert. The average size of the NP is shown (mean ± SD). (B) X-Ray diffraction (XRD) pattern of the NP. The X, and Y axes of the XRD represents the angles (2θ) of incident X-ray beam and the corresponding diffraction peak intensity.