Figure 1.

The films of SWNHs40/PS observed by scanning electron microscope.

Notes: PS dishes with a surface area of about 1 cm² and coated with SWNHs40 (0.85 μg/cm²) were prepared for SEM measurements. After being pretreated, by spraying gold on films of samples, SEM measurements were carried out using a SIRION field emission scanning electronic microscope (FEI Corporation Ltd, Hillsboro, OR, USA) with accelerating voltage of 10.0 kV. (A) 50,000×, scale bar represents 1 μm. (B) 100,000×, scale bar represents 500 nm. (C) 200,000×, scale bar represents 200 nm.

Abbreviations: SWNH, single-walled carbon nanohorn; PS, polystyrene; SEM, scanning electron microscope.