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. Author manuscript; available in PMC: 2015 Jan 9.
Published in final edited form as: J Phys Chem C Nanomater Interfaces. 2014 Jan 9;118(1):376–383. doi: 10.1021/jp409338y

Figure 6.

Figure 6

Change in high-resolution XPS N 1s peak area ratio during exposure of the PFPA–silane functionalized silicon wafer to monochromatized 1486.6 eV X-ray irradiation: relative area of the three N1s peaks to the entire N1s signal (● 400.5 eV peak, ■ 402.1 eV peak, ▲ 405.6 eV peak).