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. Author manuscript; available in PMC: 2015 Jan 9.
Published in final edited form as: J Phys Chem C Nanomater Interfaces. 2014 Jan 9;118(1):376–383. doi: 10.1021/jp409338y

Table 1.

XPS elemental composition of PFPA-silane SAM, a 1:10 mixed SAM of PFPA-silane and PFB-silane, PFB-silane SAM, PFPA-disulfide SAM, and ATFP-thiol SAM.

Atomic % F/C
N1s F1s O1s C1s Si2p S2p Au4f XPS stoichiometric value (theoretical)
PFPA-silane SAM 7.4±0.1 9.9±0.1 38.1±2.2 24.7±1.8 19.8±0.3 --- --- 0.4 0.4
PFPA-silane:PFB-silane (1:10) SAM 2.4±0.3 14.7±0.3 34.9±0.3 27.8±1.1 20.2±0.6 --- --- 0.53 0.4–0.5
PFB-silane SAM 2.3±0.1 15.7±0.2 36.9±0.7 25.5±0.5 19.6±0.1 --- --- 0.62 0.5
PFPA-disulfide SAM 4.7±1.1 8.2±0.2 7.7±1.7 41.7±1.9 --- 1.9±0.1 35.7±1.1 0.2 0.22
ATFP-thiol SAM 3.7±0.1 10.5±0.2 9.3 ±0.7 47.3±0.4 --- 1.2±0.2 27.9±0.5 0.22 0.22