Figure 11.
High-temperature pulse-echo test results using AlN thin film ultrasonic transducers at (a) room temperature; (b) 300 °C; (c) 500 °C; (d) 550 °C [83] (copyright 2012 by the American Institute of Physics).
High-temperature pulse-echo test results using AlN thin film ultrasonic transducers at (a) room temperature; (b) 300 °C; (c) 500 °C; (d) 550 °C [83] (copyright 2012 by the American Institute of Physics).