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. 2008 Feb 6;8(2):711–738. doi: 10.3390/s8020711

Figure 1.

Figure 1.

Refractive index n and extinction coefficient k of a thin Ta2O5 layer on glass (n = 1.52) versus wavelength (light source: Xe arc lamp with corresponding interference filters); measurements performed at an angle of incidence of 50° by means of spectroscopic ellipsometry (EP3, Nanofilm Technologie GmbH, Göttingen, Germany).