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. 2014 Feb 26;4:4203. doi: 10.1038/srep04203

Figure 3.

Figure 3

(a) Atomic force microscopy topography image of a ZnO thin film deposited by RF sputtering. Small grains with dimensions of tens of nanometers can be observed (b) Two-dimensional contact potential difference VCPD image of the same surface imaged in Fig. 3a. The image is acquired at an equilibrium distance of 20 nm with an oscillation of 5 nm.