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. 2014 Feb 26;9(2):e89313. doi: 10.1371/journal.pone.0089313

Table 1. Crystallographic statistics.

Complex CFP-10/ESAT-6 sagEsxA sagEsxA sagEsxA
(3FAV) SeMet native I (3GVM) native II (3GWK)
Wavelength (Å) 1.033 0.979 1.000 0.900
Space group C2 P21212 P21212 P6522
a, b, c (Å) 160.34, 23.93, 83.86 132.44, 132.52, 43.49 133.10, 132.53, 43.67 76.58, 76.58, 149.74
β (°) 94.36
Resolution range (Å)a 20-2.15 50.0-2.50 50-2.10 50-1.30
(2.21-2.15) (2.57-2.50) (2.21-2.10) (1.33-1.30)
Measured reflections 58053 138669 263051 678917
Unique reflectionsa 17336 (978) 50045 (3650) 43011 (3128) 62862 (4438)
R sym b(%)a 5.5 (19.7) 4.0 (13.1) 9.1 (50.7) 5.3 (47)
R meas c(%)a 6.5 (26.1) 4.9 (16.0) 10 (55.4) 5.5 (49.9)
Completeness 95.5 (73.4) 98 (94.7) 99.9 (99.9) 97.6 (95.2)
<I/σ(I)> g 14.4 (4.2) 19.8 (7.8) 16.8 (3.8) 23 (5.1)
Multiplicitya 3.3 (2.2) 2.8 (2.7) 6.1 (6.1) 10.8 (7.5)
Average B (Å2), overall/main chain 33.9/32.1 32.1/30.3 20.7/18.3
R cryst d(%) 20.1 18.5 14.8
R free e(%) 23.3 21.5 18.8
RMSD from ideal
Bond length (Å) 0.023 0.008 0.017
Bond angles (°) 1.34 0.89 1.32
Dihedral angles (°) 17.8 19.0 17.4
Ramachandran plotf
Most favoured region (%) 99.3 98.6 98.4
Additional allowed regions (%) 0.7 1.4 1.6
a

Numbers given in brackets are from the last resolution shell.

b

Rsym = (ΣhklΣi|Ii(hkl)-<I(hkl)>)/ΣhklΣIi(hkl), where Ii(hkl) is the intensity of the ith measurement of reflection (hkl) and <I(hkl)> is the average intensity.

c

Rmeas = (Σhkl (sqrt(Nhkl/(Nhkl-1))Σi|Ii(hkl)-<I(hkl)>)/ΣhklΣIi(hkl), where Ii(hkl) is the intensity of the ith measurement of reflection (hkl) and <I(hkl)> is the average intensity.

d

Rwork = (Σhkl|Fo-Fc|/ΣhklFo where Fo and Fc are the observed and calculated structure factors.

e

Rfree is calculated as for Rwork but from a randomly selected subset of the data (5%) which were excluded from the refinement [48].

f

Ramachandran et al., 1963 [49].

g

I is the integrated intensity and σ(I) is the estimated standard deviation of that intensity.