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. 2013 Dec 5;55(2):364–372. doi: 10.1093/jrr/rrt118

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© The Author 2013. Published by Oxford University Press on behalf of The Japan Radiation Research Society and Japanese Society for Therapeutic Radiology and Oncology.

This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/3.0/), which permits unrestricted reuse, distribution, and reproduction in any medium, provided the original work is properly cited.

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Fig. 2. — Diode measurements in solid water and MC simulated depth dose profiles on the (a) central axis (CAX), and at lateral shifts of (b) 15.2 cm, (c) 30.5 cm, (d) 45.2 cm, and (e) 61.0 cm. The depth dose profiles are shown relative to the maximum dose on CAX for the 6 MeV (squares) and 12 MeV (triangles) electron beams.