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. Author manuscript; available in PMC: 2014 Dec 15.
Published in final edited form as: IEEE Trans Signal Process. 2013 Dec 15;61(24):6291–6306. doi: 10.1109/TSP.2013.2284154

Fig. 4.

Fig. 4

The sample standard deviation of ℓF (from 100000 simulations) in object space dimensions is plotted as a function of N̄1, the mean photon count for the CPs in I1, for a constant K = 16 with (a) normally distributed, (b) uniformly distributed, (c) elliptical and (d) grid CP configurations (see Section VII-B for more details). The ‘+’ represents the sample standard deviation of the LRE (in units nanometers). The circles represent the standard deviation as predicted by Corollary V.2. The ‘×’ shows the standard deviation as predicted with (18). The dashed line marks the theoretical bound σF.