FIG 1.

Electron microscopic analysis of B. anthracis Sterne and mutant derivatives in the presence of AP50c. Bacterial strains were prepared for TEM (A to F) and SEM (G to L), as described in Materials and Methods, in the presence of AP50c phage at an MOI of 1. Phage particles are visible in association with the surfaces of strains Sterne (7702; A and G) and BA751 (Δeag; B and H) but not with the surface of strain BA754 (Δspo0A; C and I), DP-B-5747 (Δspo0B; D and J), BA755 (Δspo0F; E and K), or BA750 (Δsap; F and L). Bars, 0.2 μm (A to F) and 0.5 μm (G to L). Arrowheads, AP50c phage particles associated with the bacterial surface.