Fig. 5.

Experimental results for the three-dimensional SLM illumination in transparent media with both the conventional and extended depth of field microscope. The three-dimensional illumination pattern is shown in panel A. The relative intensity of the fluorescence as a function of depth is given to the right of panel A. The results from imaging the three-dimensional pattern in bulk fluorescent material are given for the conventional microscope (panel B) and the extended DOF microscope (panel C). Contrast was enhanced to saturate 0.1% of the pixel values in panels B and C ( Media 2 ^{(13.3MB, AVI)} ).