Figure 2. X-TEM Micrographs of 2 nm Ag/17 nm GeO_x/SiO_x/Si (100) (a) Low Mag of as-deposited (b) Low Mag of 800 °C annealed in air (c) HR-XTEM depicts endotaxial structures (with Moire fringes) and (d) X-Ray Diffraction Pattern showing the single crystalline nature of the Ag nano structures which also complimented by a Selected Area Electron Diffraction (SAD) pattern taken on a single structure.