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. 2014 Apr 10;4:4633. doi: 10.1038/srep04633

Figure 3. STEM- EDX Elemental of mapping 2 nm Ag/17 nm GeOx/SiOx/Si (100) @800°C (a) STEM Micrograph, (b) Oxygen mapping, (c) Silicon mapping, (d),(e) Germanium K,L mapping and (e) Silver mapping.

Figure 3