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. 2014 Apr 10;4:4633. doi: 10.1038/srep04633

Figure 7. X-TEM Micrographs of (a) low mag of as deposited 17 nm GeOx/2 nm Ag/SiOx/Si (100) (b) Low Mag (c) HR-X-TEM of 17 nm GeOx/2 nm Ag/SiOx/Si (100) @ 800°C in air respectively.

Figure 7