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. 2014 Mar 25;2014:209469. doi: 10.1155/2014/209469

Figure 2.

Figure 2

AFM images of the QCM chip. (a) Blank, 50 × 50 μm, (b) CNTs, 50 × 50 μm. AFM measurements could also be used for measuring the surface roughness of the QCM chip. The mean surface roughness was 1.0 and 2.3 nm for blank and CNTs surfaces, respectively.