Skip to main content
. 2008 Aug 22;47(37):9738–9746. doi: 10.1021/bi800676g

Figure 8.

Figure 8

Impact of increasing scan rate upon the taTrxR voltammetry at 308 K. Baseline-subtracted data are given to illustrate how, at elevated temperatures, the scan rate of the experiment can be raised from 200 mV/s (dotted line) to 2 V/s (dashed) to 20 V/s (solid), which results in broadening due to the observation of FO and FR states.