Fig. 3.

Measurements of wavelength-dependent attenuation in the emission-scanning system. (a) The spectrum of a NIST-traceable light source was (b) filtered by an array of TFTFs positioned for emission-scanning hyperspectral imaging. A spectral transfer function was calculated from the measured spectrum and known lamp spectrum. (c) The inverse of the spectral transfer function was normalized to a value of unity at the lowest intensity (highest correction factor value), and used to correct for wavelength-dependent attenuation through the emission-scanning system.