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. Author manuscript; available in PMC: 2015 Mar 19.
Published in final edited form as: Adv Mater. 2013 Dec 12;26(11):1763–1770. doi: 10.1002/adma.201304589

Figure 2. Evolution of localized ridges with the relaxation of uniaxially pre-strained substrate, and the wavelengths, amplitudes and aspect ratios of the ridges calculated by finite-element model.

Figure 2

The calculated evolution of the ridges in a film-substrate system with shear modulus ratio μf/μs = 1000 and pre-strain εpre1 = 100 % (a). The contour in (a) represents the maximum in-plane principal strain. The calculated wavelengths (b), amplitudes (c) and aspect ratios (d) of ridges on fully relaxed substrates as functions of μf/μs and εpre1. The experimentally measured aspect ratios of ridges match consistent with the prediction from the calculation.