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. 2014 Apr 15;4:4605. doi: 10.1038/srep04605

Figure 3.

Figure 3

(a) SEM image of SiO2 NTs. (b) EDS spectra of SiO2 NTs on selected region (yellow rectangle) of image a. (c–d) show the EDS microanalysis of element Si and O for this selected region. Scale bar: 5 μm. (e–f) EDS quantitative analysis of selected region.