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. 2014 Apr;88(8):4543–4557. doi: 10.1128/JVI.03685-13

TABLE 2.

Refinement statistics for the Fab MAb A6.2 structure

Parameter Result for Fab A6.2 structurea
PDB accession no. 4NCC
Wavelength (Å) 1.5418
Data resolution (Å) 42.5–2.5 (2.55–2.5)
No. of reflections
    Total 32,189
    Independent 20,127
Avg I/σ〈Ib 11.5 (5.5)
Completenessc 61.1 (48)
Redundancy 1.5
Rsym (%)d 18.0 (22.2)
Refinement resolution (Å) 42.5–2.5 (2.55–2.5)
Total atoms
    Nonsolvent 6,560
    Solvent 370
Rworke 20.4 (20.4)
Rfree (%)f 27.3 (29.8)
Total reflections 24,470 (930)
Avg B (Å2)
    Nonsolvent atoms 19.1
    Solvent atoms 15.7
RMSDg
    Bond length (Å) 0.011
    Bond angle (°) 1.47
Ramachandran analysis (%)
    Most favored region 95.5
    Additionally allowed 3.4
    Disallowed 1.1
a

Statistics for the highest-resolution bin of reflections are in parentheses.

b

Intensity signal/noise ratio.

c

Completeness of the unique diffraction data.

d

Rsym = ΣhΣj|Ihj − 〈Ih〉|/ΣhΣjIhj, where Ihj is the intensity of observation j of reflection h and 〈Ih〉 is the mean intensity for multiply recorded reflections.

e

Rwork = Σh‖Fo| − |Fc‖/Σh|Fo|, where Fo and Fc are the observed and calculated structure factor amplitudes for reflection h.

f

Rfree was calculated against a 10% random sampling of the reflections that were removed before structure refinement.

g

RMSD, root mean square deviation.