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. Author manuscript; available in PMC: 2014 Apr 21.
Published in final edited form as: IEEE J Solid-State Circuits. 2013 May;48(5):1290–1301. doi: 10.1109/JSSC.2013.2245058

Fig. 10.

Fig. 10

a) Die micrograph of ΣΔ modulator. b) Survey of ADCs from ISSCC and VLSI. Size of each data point indicates technology node relative to 32 nm.