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. 2014 Apr 23;4:4755. doi: 10.1038/srep04755

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(a) The impact of built-in conductance under varying pulse width and pulse amplitude. Left plot is under fixed positive amplitude (~1.88 V) and right plot is under fixed pulse width (1 ms). The built-in conductance was read at 0.1 V after each pulsing. (b) The relationship between threshold voltage and pulse width. Inset: threshold voltages extracted under linear fitting. (c) The decay performance of iron oxide-based memristor. (d) An illustration of repeatability of iron oxide memristor under consecutive pulse trains. Each of positive/negative pulse train consists of 15 pulses.