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. Author manuscript; available in PMC: 2014 Aug 30.
Published in final edited form as: Mutat Res. 2013 Jul 15;756(0):78–85. doi: 10.1016/j.mrgentox.2013.07.001

Fig. 1.

Fig. 1

Gap junction intercellular communication in the propagation of stressful effects among NB1RGB human cells exposed to low-LET X rays and high-LET silicon ions followed by 5–10 min, 3 h or 24 h incubation at 37 °C and held in a confluent or subconfluent state. (Panel (A), confluent cell cultures; Panel (B), subconfluent cell cultures; Panel (C), clonogenic survival of confluent and subconfluent cells after exposure to X rays; Panel (D), fraction of micronucleated cells in irradiated cells held in a confluent or subconfluent state after irradiation with X rays; Panel (E), clonogenic survival of confluent and subconfluent cells exposed to silicon ions; Panel (F), fraction of micronucelated cells in irradiated cells held in a confluent or subconfluent state exposed to silicon ions) (*p < 0.05; **p < 0.01).