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. 2014 Mar 17;9(1):126. doi: 10.1186/1556-276X-9-126

Figure 10.

Figure 10

Atomic force microscopy imaging and corresponding section analyses of irradiated part of samples. Atomic force microscopy imaging of irradiated part of graphene is shown at fluences (a) 1 × 1013, (c) 3 × 1013 and (e) 1 × 1014 ions/cm2, and corresponding section analyses is shown in (b), (d) and (f), respectively.