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. 2014 May 9;4:4739. doi: 10.1038/srep04739

Figure 3.

Figure 3

(a) XPS results of C-C sp2 bonding information at different depths, for which Ar ions were used to sputter the sample from surface to substrate. (b) G/2D ratios and full width at hall maximum (FWHM) as the function of the growth temperatures and crystallinity adopted from three references.