| Crystal data |
| Chemical formula |
C20H20O4
|
|
M
r
|
324.36 |
| Crystal system, space group |
Orthorhombic, P212121
|
| Temperature (K) |
92 |
|
a, b, c (Å) |
6.3744 (10), 11.961 (2), 21.041 (3) |
|
V (Å3) |
1604.3 (4) |
|
Z
|
4 |
| Radiation type |
Cu Kα |
| μ (mm−1) |
0.76 |
| Crystal size (mm) |
0.15 × 0.05 × 0.03 |
| |
| Data collection |
| Diffractometer |
Bruker Kappa APEXII DUO CCD area-detector diffractometer |
| Absorption correction |
Multi-scan (SADABS; Sheldrick, 2004 ▶) |
|
T
min, T
max
|
0.895, 0.978 |
| No. of measured, independent and observed [I > 2σ(I)] reflections |
47918, 2879, 2708 |
|
R
int
|
0.046 |
| (sin θ/λ)max (Å−1) |
0.603 |
| |
| Refinement |
|
R[F
2 > 2σ(F
2)], wR(F
2), S
|
0.026, 0.061, 1.03 |
| No. of reflections |
2879 |
| No. of parameters |
277 |
| H-atom treatment |
Only H-atom coordinates refined |
| Δρmax, Δρmin (e Å−3) |
0.13, −0.13 |
| Absolute structure |
Flack x parameter determined using 1096 quotients [(I
+) − (I
−)]/[(I
+) + (I
−)] (Parsons et al., 2013 ▶) |
| Absolute structure parameter |
−0.03 (6) |