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. 2013 Mar 21;4(1):38–58. doi: 10.3390/jfb4010038

Table 1.

Measured dimensions of topographies from scanning electron microscopy (SEM) images.

Topography Designed dimensions (nm) Measured dimensions (nm)
Diameter Diameter Pitch
1 μm pillars 1000 1500 ± 20 6810 ± 60
1 μm wells 1000 1180 ± 40 6890 ± 60
200 nm pillars 200 193 ± 11 333 ± 18
250 nm wells 250 223 ± 21 391 ± 16