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. 2014 Mar 31;8(5):4730–4739. doi: 10.1021/nn500526t

Figure 4.

Figure 4

2D GIWAXS profiles for TTD annealing of MBCP-Al2O3 perovskite films in nitrogen after (a) 3, (b) 50, (c) 60, and (d) 120 min, together with (e) azimuthally integrated intensity plots. The dotted line at q ≈ 11 nm–1, dashed line at q = 10 nm–1, and dash-dotted line at q = 9 nm–1 denote the signature scattering peaks for the crystalline precursor, perovskite, and PbI2 structures, respectively. The difference in background brightness of the GIWAXS patterns is a shadow artifact of the experimental setup.