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. Author manuscript; available in PMC: 2015 Jun 1.
Published in final edited form as: Ophthalmology. 2014 Feb 15;121(6):1194–1202. doi: 10.1016/j.ophtha.2013.12.027

Figure 1.

Figure 1

An illustration of iris curvature (ICURV), iris thickness measured at 750 μm from the scleral spur (IT750), iris thickness measured at 2000 μm from the scleral spur (IT2000), and maximal iris thickness (ITM). For parameters associated with iris thickness, a circle centered at the scleral spur was drawn with a radius of 750 μm, and the point of intersection between the circle and the anterior surface of the iris was identified. The shortest distance from this point to the posterior surface of the iris was calculated for IT750. The same method was used for IT2000. ITM was defined as the highest value of iris thickness along the entire iris. To calculate ICURV, a line was drawn from the most peripheral to the most central point of the iris pigmented epithelium, and a perpendicular line was extended from this line to the iris pigmented epithelium at the point of greatest convexity.