Agilent Eos Gemini diffractometer	3262 independent reflections
Radiation source: Enhance (Cu) X-ray Source	2913 reflections with I > 2σ(I)
Detector resolution: 16.0416 pixels mm-1	Rint = 0.030
ω scans	θmax = 71.6°, θmin = 5.4°
Absorption correction: multi-scan (CrysAlis PRO and CrysAlis RED; Agilent, 2012)	h = −4→8
Tmin = 0.851, Tmax = 1.000	k = −10→10
5113 measured reflections	l = −19→19