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. 2014 Jun 11;4:5255. doi: 10.1038/srep05255

Figure 2. TEM images of BTFO film deposited on Pt/Ti/SiO2/Si substrate.

Figure 2

A medium and a high magnification bright-field TEM image are shown in (a) and (b), respectively. In (b), the high quality of the layered structure is clearly visualized. In a dark-field TEM image, as shown in the inset, stripes corresponding to ferroelectric domains in a single grain can be observed.