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. 2014 Jun 11;4:5248. doi: 10.1038/srep05248

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(a) In a symmetric layer system, Bloch walls are favored (orange arrows), on which the spin Hall current (green spins) cannot exert a torque. (b) If SIA is introduced, chiral Néel walls with alternating orientation become stable, which are moved uniformly (yellow arrows) by the effective spin Hall field H_SHE ∝ cos ϕ. (c) The in-plane DW angle ϕ (orange) is determined by the competition of the DMI field H_D (violet) and the DW anisotropy field H_K (pink). (d) The internal angle can be further tuned using an external magnetic field H_x (light blue) or H_y (not shown). (e) DW resistance measurements can be used to verify the DW angle ϕ under influence of H_x and H_y. This can be linked to DW motion measurements on the same samples (f), where the depinning field H_z_,depin as a function of current density J is measured for the two outermost DWs. The slope of this relation defines the depinning efficiency of each DW, which scales with cos ϕ. The Kerr micrographs show the well-controlled alternating pattern of up (white) and down (grey) domains, realized by Ga irradiation of the white areas.

Inline graphic — (a) In a symmetric layer system, Bloch walls are favored (orange arrows), on which the spin Hall current (green spins) cannot exert a torque. (b) If SIA is introduced, chiral Néel walls with alternating orientation become stable, which are moved uniformly (yellow arrows) by the effective spin Hall field H_SHE ∝ cos ϕ. (c) The in-plane DW angle ϕ (orange) is determined by the competition of the DMI field H_D (violet) and the DW anisotropy field H_K (pink). (d) The internal angle can be further tuned using an external magnetic field H_x (light blue) or H_y (not shown). (e) DW resistance measurements can be used to verify the DW angle ϕ under influence of H_x and H_y. This can be linked to DW motion measurements on the same samples (f), where the depinning field H_z_,depin as a function of current density J is measured for the two outermost DWs. The slope of this relation defines the depinning efficiency of each DW, which scales with cos ϕ. The Kerr micrographs show the well-controlled alternating pattern of up (white) and down (grey) domains, realized by Ga irradiation of the white areas.