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. 2014 Jun 12;4:5271. doi: 10.1038/srep05271

Table 1. Full presentation of the critical strain for buckling and the geometry of every specimen examined here and previously (ref. 3). Strain correction has only been implemented for data the slope of which lies outside the boundaries of the standard deviation value of ±5 cm−1/% from the mean absolute value (60 cm−1/%).

aNominal applied strain at failure (%) l (μm) w (μm) Configuration 2D shift rate|cm−1/%| Critical (graphene) strain (%) Kw (GPa/nm) Half-wave number, m Half-wave length, λ(nm)
−0.67 5 70 4pb 46.8 0.52c 4.88 3742 1.33
−1.25b 6 56 Cantilever 39.4 0.82c 12.14 5639 1.06
−0.62 6 30 4pb 60.1 0.62 6.94 4742 1.26
−0.68 4 21 4pb 38.0 0.45c 3.34 2722 1.46
−0.64b 11 50 Cantilever 55.1 0.64 5.46 8467 1.29
−0.61 28 23 Cantilever 69.6 0.61 6.72 22701 1.22
−0.53b 56 25 Cantilever 59.1 0.53 5.07 42314 1.31
−0.71 30 6 4pb 56.4 0.71 9.36 26423 1.12
−0.58 22 14 4pb 60.3 0.58 6.07 17388 1.26

a. Applied strain calculated from beam Equation. b. Data from reference 14.c. Corrected data for short transfer length (equation 1).