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. Author manuscript; available in PMC: 2014 Jun 16.
Published in final edited form as: Nano Today. 2013 Aug 6;8(4):347–387. doi: 10.1016/j.nantod.2013.07.001

Table 2.

Nanostructure preparation techniques and their minimum feature size.

Fabrication method Min. feature size Advantages/limitations
Optical lithography [29,31,32,52] ~50 nm Precise patterns can be created.
X-ray lithography [30,52] ~20 nm Requires expensive optical lenses.
E-beam lithography [27,5255] 5–10 nm Controlled geometries can be achieved. Serial, time consuming process.
Colloidal lithography [52,56] ~300 nm Random geometries.
Nano-embossing [34] ~100 nm Controllable geometries and patterns.
Etching polymer [35] >1 nm Inexpensive method but produces random nanostructures.
Etching silicon wafer [3638] 2–3 nm No control on dimensions and pore sizes unless using aluminum template.
Reactive ion etching [39] 20–100 nm High aspect ratio patterns.
Electrospinning [44] 40–2000 nm Over 20 polymers can be used; limited to only fiber formation.
Chemical vapor deposition [4548] ~2 nm Require high vacuum furnaces, slow process especially in the case of epitaxy but layer thickness can be well controlled.
Vapor-phase coating [49] 100–500 nm Easy fabrication method but the coatings are not very stable.
Gas foaming [50] 0.1–100 nm Low-cost method but not widely applicable.
Phase separation [51] >1 nm Nanofeatures and pore sizes cannot be controlled precisely.