Table 2.
Nanostructure preparation techniques and their minimum feature size.
Fabrication method | Min. feature size | Advantages/limitations |
---|---|---|
Optical lithography [29,31,32,52] | ~50 nm | Precise patterns can be created. |
X-ray lithography [30,52] | ~20 nm | Requires expensive optical lenses. |
E-beam lithography [27,52–55] | 5–10 nm | Controlled geometries can be achieved. Serial, time consuming process. |
Colloidal lithography [52,56] | ~300 nm | Random geometries. |
Nano-embossing [34] | ~100 nm | Controllable geometries and patterns. |
Etching polymer [35] | >1 nm | Inexpensive method but produces random nanostructures. |
Etching silicon wafer [36–38] | 2–3 nm | No control on dimensions and pore sizes unless using aluminum template. |
Reactive ion etching [39] | 20–100 nm | High aspect ratio patterns. |
Electrospinning [44] | 40–2000 nm | Over 20 polymers can be used; limited to only fiber formation. |
Chemical vapor deposition [45–48] | ~2 nm | Require high vacuum furnaces, slow process especially in the case of epitaxy but layer thickness can be well controlled. |
Vapor-phase coating [49] | 100–500 nm | Easy fabrication method but the coatings are not very stable. |
Gas foaming [50] | 0.1–100 nm | Low-cost method but not widely applicable. |
Phase separation [51] | >1 nm | Nanofeatures and pore sizes cannot be controlled precisely. |