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. 2014 Jun 2;5:3990. doi: 10.1038/ncomms4990

Figure 5. Contributions of trapped and interface charges.

Figure 5

(a) Magnitude of the positive and negative terms (+ and − columns, respectively) in Equation (10) for all junctions in HRS. (b) Calculated modulation of trapped charged centroid during resistive switching, ΔQT=QT(LRS)−QT(HRS). (c) Simplified charge density profile for a Pt/Nb:SrTiO3 junction with interface states and trapped charge in the interface layer.