Hypothesis test results (p-values) with multiple testing correction results (FDR corrected p-values in parentheses) for registration results measured via landmark errors for TEM/confocal images. We use a one-sided paired t-test. Comparison of different image types (original image, standard IA, proposed IA) using the same registration models (rigid, affine, B-spline). The proposed image analogy method performs better for affine and B-spline deformation models. (Bold indicates statistically significant improvement at a significance level α = 0.05 after correcting for multiple comparisons with FDR.)