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. 2014 Jun 13;9(1):301. doi: 10.1186/1556-276X-9-301

Figure 10.

Figure 10

Cross-sectional TEM micrographs of the upper part of the thin film and AFM phase images. (a, b) Cross-sectional TEM micrograph of the upper part of the thin film and AFM surface phase image for the ISS process. (c, d) Cross-sectional TEM micrograph of the upper part of the thin film and AFM surface phase image for the LbL-E deposition technique.