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. 2014 Jun 10;9(1):292. doi: 10.1186/1556-276X-9-292

Figure 1.

Figure 1

TEM images of the RRAM device. (a) A typical cross-sectional TEM image of a W/TaOx/TiN memory device. The device size is 0.6 × 0.6 μm2. (b) A HRTEM image showing the stacking layer of TaOx and TiOx.