Figure 1.
TEM images of the RRAM device. (a) A typical cross-sectional TEM image of a W/TaOx/TiN memory device. The device size is 0.6 × 0.6 μm2. (b) A HRTEM image showing the stacking layer of TaOx and TiOx.
TEM images of the RRAM device. (a) A typical cross-sectional TEM image of a W/TaOx/TiN memory device. The device size is 0.6 × 0.6 μm2. (b) A HRTEM image showing the stacking layer of TaOx and TiOx.