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. 2014 Jun 25;4:5430. doi: 10.1038/srep05430

Figure 1.

Figure 1

(A) The experimental apparatus is located at the ID13 beamline of the European Synchrotron Radiation Facility (ESRF) and features an electron undulator providing 12.4 keV X-rays to crystal optics delivering a 1 µm beam spot on the sample. The sample holder houses a 1 mm-diameter quartz capillary containing the nerve and the culture medium. The x-y translator allows the sample to move in both horizontal and vertical directions with a sampling step of 5 µm within a selected area. The X-rays scattered by the sample are recorded by a FReLoN detector. (B) Intensity of the x-ray diffraction reflections after background subtraction, with respect to the impinging beam of the sciatic nerve bathed in normal Ringer's solution at pH 7.3 for the native nerve. The intensity (in arbitrary units) is plotted against the reciprocal distance (Å−1). (C) Colormap of the integrated intensity of the myelin XRD diffraction pattern measured point by point of a full native nerve. The intensity is greater in the centre and decreased at the edges of the nerve due to the differing quantities of myelinated axons traversed by the beam in these different locations. This is caused by the generally cylindrical shape of the nerve. The bar corresponds to 100 μm.