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. 2014 Jun 30;4:5497. doi: 10.1038/srep05497

Figure 2. Grain structures in monolayer GaSe crystals.

Figure 2

(a) Bright-field TEM image of a single monolayer triangular flake. Inset is the SAED pattern of the flake, showing a single set of spots in a hexagonal pattern. (b) DF-TEM image of the flake in (a). (c) Bright field TEM image showing two monolayer triangular flakes merging together. Inset is the SAED pattern obtained from the common area of the two flakes as indicated by a dashed circle. The pattern shows two sets of spots in a hexagonal pattern (indicated by red and green dashed-lines, respectively) with orientated ~30° apart. (d) Color-coded overlay of DF-TEM images corresponding to the red- and green-circled diffraction spots in the inset of (c). (e) Bright-field TEM image of an area containing both monolayer triangular flakes and large islands of merged flakes. Inset is the electron diffraction pattern obtained from the whole area in (e). (f) Color-coded overlay of DF-TEM image of the area in (e). The overlapped crystal grains are indicated by the white arrows and the clear grain boundaries are indicated by the red arrows.