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. 2014 Jun 30;4:5497. doi: 10.1038/srep05497

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(a–c) SEM images of GaSe crystals grown with an 80 sccm argon flow for 5 min. Images (a) and (b) were obtained from the region close to the downstream side of the substrate. The flakes with lighter contrast are monolayer, while darker flakes indicate additional layers grown on monolayer flakes. (b) is the enlarged image of the area contained in the dashed square in (a). Image (c) shows thicker multi-layer GaSe crystals on a continuous monolayer GaSe film grown in the region close to the upstream side of the substrate. (d–f) AFM images of multi-layer GaSe crystals. Insets are line profiles along the dashed arrows.