Figure 4. Use of scikit-image to study silicon wafer impurities.

(A) An image of an as-cut silicon wafer before it has been processed into a solar cell. (B) A PL image of the same wafer. Wafer defects, which have a negative impact solar cell efficiency, are visible as dark regions. (C) Image processing results. Defects in the crystal growth (dislocations) are colored blue, while red indicates the presence of impurities.