. 2014 Jul 15;9(7):e102715. doi: 10.1371/journal.pone.0102715

Table 3. SDS and REML estimates of heritability for wheat grain yield in four environments (E1–E4)^a.

Environment	SDS			REML
	h ²	SD	CI95 ^b	h ²	SD	CI95
E1	0.564	0.086	0.362–0.706	0.498	0.049	0.399–0.589
E2	0.452	0.114	0.192–0.629	0.448	0.048	0.324–0.520
E3	0.379	0.070	0.223–0.497	0.423	0.061	0.305–0.544
E4	0.481	0.071	0.304–0.587	0.430	0.058	0.292–0.524

The estimates of heritability for the wheat data set taken from Crossa et al. [33] by the symmetric difference squared (SDS) method and a residual maximum likelihood (REML) method, GCTA.

The 95% confidence intervals (CI 95) are constructed based on 1000 bootstrap samples.

Table 3. SDS and REML estimates of heritability for wheat grain yield in four environments (E1–E4)a.

Table 3. SDS and REML estimates of heritability for wheat grain yield in four environments (E1–E4)^a.