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. 2014 Jul 16;4:5694. doi: 10.1038/srep05694

Figure 3. Inverse FFT images of an Inline graphic/Inline graphic composite particle obtained by placing masks on the FFT patterns.

Figure 3

(a) Inverse FFT image of Inline graphic (111) planes before electron beam irradiation. (b) Inverse FFT image of Inline graphic (003) planes before electron beam damage, and the ADF-STEM image in the inset shows an example for the orientation relationship between the Inline graphic and Inline graphic structures. (c) Inverse FFT image of the Inline graphic/Inline graphic composite particle before electron beam damage. (d) Inverse FFT image of the Inline graphic/Inline graphic composite particle after electron beam irradiation. The diffraction spots masked for inverse FFT imaging are shown in the insets, where the purple and yellow spots correspond to Inline graphic and Inline graphic phases, respectively.